PEIR-Plan-100x
PE IR Plan Series
High-resolution objectives for near infrared wavelengths up to 1600nm.
Applications include laser marking, laser cutting and photo emission detection. LCD and Silicon thickness corrected versions available.
Technical Specifications
Image Circle (mm):
24
Magnification:
100x
Working Distance:
9.5
Focal Length (mm):
2
N.A.:
0.71
RP (μm):
0.9
DOF (μm):
0.9
Weight (g):
560
- Color corrected between 800nm – 1600nm with high transmission in this range
- Commonly used for laser marking and cutting and in photo emission applications
- LCD and Silicon substrate thickness corrected versions available.